Thomas Lanzisero is a Technical Learning & Development Manager and Corporate Fellow at UL
(Underwriters Laboratories) in Melville, NY. Tom holds a Bachelor of Electrical Engineering degree and
a Professional Engineer (PE) license, and continues his post-graduate education and training.
Having considerable experience in the applied practice of safety engineering, Tom is co-author of Hazard
Based on Safety Engineering, a UL Safety Science book bridging engineering sciences and the field of
product safety. He also led the development of the UL Applied Safety Science and Engineering Techniques
(ASSET) Safety Management process, integrating hazard analysis, risk assessment, quality and supply
chain management, and systems engineering. Tom’s extensive work in hazard analysis and risk
assessment has been applied to a broad range of product investigations and the development of
standards and codes, including research in electric shock (electropathology and protection) and fire
and explosion hazards (lithium-ion batteries and flammable refrigerants). He has served as technical
expert on key US Technical Advisory Groups and international (IEC) technical committees and has
many peer-reviewed publications. Tom also judges international competitions for FIRST Robotics.
An IEEE Senior Member, Tom is presently Chair of the LI Chapter of the IEEE Systems Council. He has
served on the Board of Directors of the IEEE Product Safety Engineering Society (PSES), as Chair
of the IEEE Long Island, NY Section, Vice Chair of the IEEE Risk Assessment Technical Committee (RATC)
and Founding Chair of the LI Chapter of the IEEE Product Safety Engineering Society (PSES). Tom is
also a member of other IEEE societies including Communications, Engineering in Medicine and
Biology, Industry Applications, Power & Energy, Professional Communication, Reliability, and Vehicular
Technology. Tom has also held memberships in other technical professional organizations, including
the NFPA, ASSE, IAEI, SAE, SME, QAI, NSPE, NYSSPE, and the Knowledge Foundation.