Angelo Genovese IEEE Region: 8 (Africa, Europe, Middle East) Email Biography Angelo Genovese was born in Benevento, Italy, on February 19th, 1985. He received the B.Sc., M.Sc., and Ph.D. degrees in Computer Science in 2007, 2010, and 2014 respectively, from Università degli Studi di Milano, Italy. From 2014 to 2019 he was a Postdoctoral Research Fellow and since 2015 he is a member of the Industrial, Environmental, and Biometric Informatics Laboratory (IEBIL) at the Università degli Studi di Milano, Italy. He was a Visiting Researcher at the University of Toronto, ON, Canada from June 2017 to August 2017 and from December 2019 to March 2020. Since 2019 he is Assistant Professor at Università degli Studi di Milano, Italy, Department of Computer Science. His research interests include signal and image processing, pattern recognition, three-dimensional reconstruction, artificial intelligence technologies, design methodologies, and algorithms for self-adapting systems, applied to industrial and environmental monitoring systems and biometric recognition. In the biometrics field, his focuses are on highly usable touch-based and touchless recognition based on palmprint and fingerprint, as well as recognition based on soft biometric traits. He is an Associate Editor of the Springer Journal of Ambient Intelligence and Humanized Computing (AIHC) and Elsevier Array. He was a Member of the Editorial Committee for the Elsevier Book Trends in Deep Learning Methodologies. He has served as Program Chair/Co-Chair for the IEEE Int. Conf. on Computational Intelligence and Virtual Environments for Measurement Systems and Applications (CIVEMSA) (2020, 2019, 2018) and the IEEE Workshop on Environmental, Energy, and Structural Monitoring Systems (EESMS) (2018, 2017). He is a Member of the IEEE, the IEEE Biometrics Council, the IEEE Computational Intelligence Society Task Force on Deep Learning, and the GRIN (Gruppo di Informatica). He is the Chair of the IEEE Italy Section Systems Council Chapter and the Co-Chair of the IEEE Instrumentation and Measurement Society Technical Commitee TC-22 - Intelligent Measurement Systems.